Side scan sonar and interferometric noise

This paper concerns the description of different noise sources encountered as well as the impact of each of these sources through sonar interferometric data acquisition. The impact of noise is directly linked to the ability of the Vernier device to determine the 2π ambiguity of the phase measure and to know the altitude of the bottom. The main conclusion of this paper concerns the theoretical interest of the conducted approach in terms of the obtained results as well as in order to reduce the impact of these noise sources through the physical and the analytical comprehension of the data acquisition process