Lowering the uncertainty in fast noise measurement procedures

To completely characterise the noise behaviour of a two port device, four noise parameters F_min, R_n, G_opt and B_opt must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 μm δ-doped HEMT devices by Alenia, demonstrating that the common hot-cold measurement procedure can result in an error confidence as low as 0.2% for all the noise parameters