• DocumentCode
    1744311
  • Title

    A novel method for determining bulk diffusion length in bifacial silicon solar cells

  • Author

    Kreinin, Lev ; Bordin, Ninel ; Eisenberg, Naftali

  • Author_Institution
    Jerusalem Coll. of Technol., Israel
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    248
  • Lastpage
    251
  • Abstract
    In contrast with the usual methods using Q(λ) with back illumination to determine the bulk diffusion length L in bifacial solar cells, the proposed method determines the actual parameters of the back doped layer and also an absolute, not differential L which is usually dependant on irradiance level. The experimental data needed are: Q(λ) measured at low irradiance, and Isc, measured at high irradiance of known spectral distribution. The essence of the method is the determination at low irradiance of the recombination parameters of the base region and the back doped layer by comparison of calculated and experimental Q(λ) data and use of these parameters (except L) with L as a variable to calculate Q(λ) at high irradiance. The agreement of the measured Isc and that calculated by integration of Q(λ) over the light spectrum yields the correct value of L
  • Keywords
    carrier lifetime; elemental semiconductors; minority carriers; silicon; solar cells; Q(λ); Si; back doped layer; bifacial silicon solar cells; bulk diffusion length determination; high irradiance; low irradiance; short circuit current; spectral distribution; Absorption; Educational institutions; Equations; Length measurement; Lighting; Photovoltaic cells; Radiative recombination; Silicon; Uncertainty; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915804
  • Filename
    915804