Title :
In-situ measurements of Cu(In,Ga)Se2 composition by X-ray fluorescence
Author :
Eisgruber, I.L. ; Treece, R.E. ; Hollingsworth, R.E. ; Engel, J.R. ; Britt, J.
Author_Institution :
ITN Energy Syst., Wheat Ridge, CO, USA
Abstract :
Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ X-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the X-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented
Keywords :
X-ray fluorescence analysis; copper compounds; gallium compounds; indium compounds; solar cell arrays; ternary semiconductors; Cu(In,Ga)Se2 composition; Cu(InGa)Se2; Se environment; X-ray fluorescence; X-ray signals analysis; in-situ X-ray fluorescence; in-situ composition measurements; large-scale power production; photovoltaic module fabrication; reproducibility; sensor; sensor equipment design; yield; Area measurement; Fabrication; Fluorescence; Large-scale systems; Monitoring; Photovoltaic systems; Production; Reproducibility of results; Sensor phenomena and characterization; Solar power generation;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915882
