DocumentCode
1744330
Title
In-situ measurements of Cu(In,Ga)Se2 composition by X-ray fluorescence
Author
Eisgruber, I.L. ; Treece, R.E. ; Hollingsworth, R.E. ; Engel, J.R. ; Britt, J.
Author_Institution
ITN Energy Syst., Wheat Ridge, CO, USA
fYear
2000
fDate
2000
Firstpage
505
Lastpage
508
Abstract
Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ X-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the X-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented
Keywords
X-ray fluorescence analysis; copper compounds; gallium compounds; indium compounds; solar cell arrays; ternary semiconductors; Cu(In,Ga)Se2 composition; Cu(InGa)Se2; Se environment; X-ray fluorescence; X-ray signals analysis; in-situ X-ray fluorescence; in-situ composition measurements; large-scale power production; photovoltaic module fabrication; reproducibility; sensor; sensor equipment design; yield; Area measurement; Fabrication; Fluorescence; Large-scale systems; Monitoring; Photovoltaic systems; Production; Reproducibility of results; Sensor phenomena and characterization; Solar power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915882
Filename
915882
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