• DocumentCode
    1744367
  • Title

    a-Si:H-based triple-junction cells prepared at i-layer deposition rates of 10 a/s using a 70 MHz PECVD technique

  • Author

    Jones, S.J. ; Liu, T. ; Deng, X. ; Izu, M.

  • Author_Institution
    Energy Conversion Devices Inc., Troy, MI, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    845
  • Lastpage
    848
  • Abstract
    Using a 70 MHz VHF PECVD technique to prepare all of the i-layers at deposition rates near 10 Å/s, a-Si:H/a-SiGe:H/a-SiGe:H triple-junction cells have been fabricated and initial active area AM1.5 efficiencies of 11% (total area efficiencies of 10-10.3%) have been achieved. After 700 hrs, of light soaking of one sun light soaking, the cell efficiencies degrade to 9.6% with a percentage of degradation of 10-14%, a percentage typical of what is obtained for high efficiency triple-junction cells prepared using i-layer deposition rates near 1 Å/s. A major challenge toward further improving the efficiencies is the fabrication of a-SiGe:H i-layers at 10 a/s with the quality of those made using the standard 13.56 MHz, 1 Å/s method. Deposition conditions that lead to less polyhydride formation during a-SiGe:H growth would likely lead to improved performance for the triple-junction cells
  • Keywords
    Ge-Si alloys; amorphous semiconductors; elemental semiconductors; hydrogen; p-n heterojunctions; plasma CVD; plasma CVD coatings; semiconductor growth; semiconductor thin films; silicon; solar cells; 10 to 10.3 percent; 11 percent; 70 MHz; 700 h; 9.6 percent; Si:H; Si:He-SiGe:H-SiGe:H; VHF PECVD technique; a-Si:H-based triple-junction cells; a-Si:H/a-SiGe:H/a-SiGe:H triple-junction cells; i-layer deposition rates; i-layers; initial active area AM1.5 efficiencies; one sun light soaking; solar cells; Ambient intelligence; Buffer layers; Costs; Degradation; Fabrication; Frequency; Indium tin oxide; Photovoltaic cells; Production; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916015
  • Filename
    916015