DocumentCode
1744368
Title
Influence of hydrogen, boron, and ion energy on the structure of microcrystalline silicon in plasma-assisted chemical vapor deposition
Author
Oshita, Yuichi ; Okitsu, K. ; Imaizumi, Masayuki ; Yamaguchi, K. ; Yamaguchi, M. ; Hara, T. ; Ito, T. ; Fukushima, H. ; Ryoji, M. ; Fujii, S. ; Kawamura, K.
Author_Institution
Toyota Technol. Inst., Nagoya, Japan
fYear
2000
fDate
2000
Firstpage
849
Lastpage
852
Abstract
Si films are deposited by electron beam excited plasma CVD. Microcrystalline Si with no preferential orientation is grown at 300°C from 100% SiH4 without H2 dilution. The grain size increases as the substrate temperature increases. The film structure becomes columnar caused by the higher temperature, the B doping, and the decrease of the ion energy. We discuss the influences of the hydrogen injection, the in-situ impurity doping, and the ion energy on the crystalline structures
Keywords
boron; electron beam applications; elemental semiconductors; grain size; hydrogen; impurities; plasma CVD; plasma CVD coatings; semiconductor doping; semiconductor growth; semiconductor thin films; silicon; solar cells; substrates; 300 C; B doping; Si films; Si:B; SiH4; boron doping; columnar film structure; crystalline structures; electron beam excited plasma CVD; grain size; hydrogen; hydrogen injection; in-situ impurity doping; ion energy; microcrystalline silicon; plasma-assisted chemical vapor deposition; substrate temperature; thin film solar cells; Boron; Crystallization; Doping; Electron beams; Grain size; Hydrogen; Impurities; Plasma temperature; Semiconductor films; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.916016
Filename
916016
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