• DocumentCode
    1744377
  • Title

    Power degradation studies of the Mir solar array return experiment

  • Author

    Brinker, David J. ; Scheiman, David A.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1071
  • Lastpage
    1074
  • Abstract
    A Russian solar array was recently returned from the Mir space station after 125 months on-orbit and made available to US investigators for detailed post-flight analysis. The array, consisting of eight panels of silicon cells, was deployed on June 16, 1987 as one of four segments of an array located directly above the Kvant-2 module. After removal and packaging by Russian cosmonauts in November, 1997, it was brought back to Earth by the STS-89 mission two months later. Detailed post-flight performance measurements of one panel show that its overall power conversion efficiency degraded from a BOL value of about 9% to 4.8%, due not to an overall degradation in cell conversion efficiency but rather to circuit disruptions in several of the parallel connected strings. In this paper, the photovoltaic post-flight analysis is presented, as well as a detailed description of the array technology
  • Keywords
    aerospace testing; semiconductor device measurement; semiconductor device testing; solar cell arrays; space vehicle power plants; 125 month; 4.8 percent; 9 percent; Kvant-2 module; Mir solar array return experiment; Si; array technology; circuit disruptions; parallel connected strings; post-flight analysis; post-flight performance measurements; power conversion efficiency; power degradation studies; Circuits; Degradation; Earth; Measurement; Packaging; Photovoltaic systems; Power conversion; Silicon; Solar power generation; Space stations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916072
  • Filename
    916072