Title :
Analysis of R&D globalization and public sector linkages in Japanese firms in the 1990s: the case of electronics and pharmaceuticals
Author :
Miyazaki, Kumiko ; Yamada, Akihisa
Author_Institution :
Dept. of Ind. Eng. & Manage., Tokyo Inst. of Technol., Japan
Abstract :
This paper is based on an analysis of R&D globalization of 14 large companies in the electronics and pharmaceutical sectors in Japan. It is based on a systematic analysis of bibliometric data, combined with an analysis of questionnaire data. The authors´ findings suggest that in both industries, R&D globalization has gained momentum in the 1990s. They analyzed the R&D activities carried out by foreign-affiliated companies independently, as well as through collaboration with foreign universities and public sector research centres. The electronics sector started the globalization process earlier than the pharmaceutical sector. The results from the statistical analysis show that variation exists in the degree and pattern of R&D globalization among firms in the same sector. Analysis of the motives for R&D globalization suggests that technology factors are important for both industries. While technology factor is more important for the electronics sector, technology and demand factors are both important for the pharmaceutical sector
Keywords :
electronics industry; pharmaceutical industry; research and development management; technology transfer; Japan; R&D globalization; R&D management; bibliometric data; collaboration; demand factors; electronics firms; innovation technology transfer; motives; pharmaceuticals firms; public sector linkages; public sector research centres; questionnaire data; statistical analysis; technology factors; universities; Bibliometrics; Collaboration; Computer aided software engineering; Couplings; Data analysis; Educational institutions; Globalization; Pharmaceutical technology; Production; Research and development;
Conference_Titel :
Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on
Print_ISBN :
0-7803-6652-2
DOI :
10.1109/ICMIT.2000.917346