Title :
Fault-tolerance scheme for an RNS MAC: performance and cost analysis
Author :
Preethy, A.P. ; Radhakrishnan, D. ; Omondi, A.
Author_Institution :
Dept. of Comput. Sci., Georgia State Univ., Atlanta, GA, USA
Abstract :
Residue number systems (RNS) are especially useful in applications in which fault-tolerance is a requirement. Accordingly, this paper discusses a novel and elegant fault-tolerance scheme incorporated into a multiply-accumulate (MAC) unit based on RNS. The fault-tolerance is achieved by using inexpensive forward conversion procedures. The cost and performance are analyzed with respect to other designs, and the analysis indicates superior cost:performance measure for our design
Keywords :
fault tolerant computing; multiplying circuits; residue number systems; RNS MAC; cost analysis; cost:performance measure; fault-tolerance scheme; forward conversion procedures; multiply-accumulate unit; residue number systems; Application software; Arithmetic; Cathode ray tubes; Computer science; Costs; Equations; Error correction; Fault tolerance; Fault tolerant systems; Performance analysis;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.921171
