DocumentCode
1745006
Title
An analog similarity evaluation circuit featuring variable functional forms
Author
Yamasaki, T. ; Shibata, Tadashi
Author_Institution
Dept. of Inf. & Commun. Eng., Tokyo Univ., Japan
Volume
3
fYear
2001
fDate
6-9 May 2001
Firstpage
561
Abstract
An analog similarity evaluation circuit has been developed that calculates the similarity measures among vectors with real-time alterable functional forms. Besides the capability of template vector updating, the weight and the strictness of the similarity measure can be altered element by element by control signals. Experimental results from fabricated silicon demonstrate the advantages of the circuit in terms of the flexibility in evaluating similarity
Keywords
CMOS analogue integrated circuits; analogue processing circuits; neural chips; CMOS; analog similarity evaluation circuit; control signals; flexibility; real-time alterable functional forms; strictness; template vector updating; variable functional forms; weight; Application software; CMOS technology; Circuit testing; Informatics; Inverters; Neurons; Nonvolatile memory; Real time systems; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.921372
Filename
921372
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