A versatile CMOS low-noise analog front-end stage for solid state detector interfaces

Author

Haralabidis, N. ; Loukas, D.

Author_Institution

Inst. of Microelectron., N.C.S.R. Demokritos, Athens, Greece

Volume

1

fYear

2001

fDate

6-9 May 2001

Firstpage

364

Abstract

A front-end stage has been designed for use in solid state detector systems. Its novelty lies in the fact that the preamplifier stage provides dual mode outputs: i) a voltage step that corresponds to the total integrated charge and ii) a fast differential signal that corresponds to the current pulse released by the detector. The first output signal is processed by a S-G shaper and used for low/medium rate, low noise applications (peaking time 100 ns, ENC=300e @3pF external capacitance). The second one is used for high rate applications (peaking time 40 ns. ENC=440e @3pF external capacitance). It is intended for use in a luggage inspection system where X-ray radiation is directly converted to charge employing CdTe detectors. The circuit has been implemented in a 0.6 μm CMOS process

Keywords

CMOS analogue integrated circuits; X-ray detection; detector circuits; preamplifiers; 0.6 micron; CMOS low-noise analog front-end circuit; CdTe; X-ray radiation; charge integrating mode; current amplifying mode; luggage inspection system; preamplifier; semi-Gaussian shaper; solid-state detector interface; Capacitance; Inspection; Noise shaping; Preamplifiers; Radiation detectors; Signal processing; Solid state circuits; Voltage; X-ray detection; X-ray detectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.921868

Filename

921868