Structural testing of pipelined analog to digital converters

Author

Peralías, Eduardo J. ; Rueda, Adoración ; Huertas, José L.

Author_Institution

Inst. de Microelectron., Seville Univ., Spain

Volume

1

fYear

2001

fDate

6-9 May 2001

Firstpage

436

Abstract

This paper presents two alternative BIST schemes for structural testing of pipelined ADCs. The operational principle of both strategies relies on testing each of the ADC stages reconfigured as an A/D-D/A block and applying as input a set of analog values. These values are DC stimuli giving a simple output signature. The new techniques are intended for being used in pipelined converters of an arbitrary number of conversion stages and with a digital self-correction mechanism

Keywords

analogue-digital conversion; built-in self test; integrated circuit testing; pipeline processing; redundancy; A/D-D/A block; BIST schemes; DC stimuli; analog valued input; arbitrary number of conversion stages; digital self-correction mechanism; hardware redundancy; operational principle; pipelined ADC; simple output signature; structural testing; Analog-digital conversion; Built-in self-test; Controllability; Costs; Electric variables measurement; Electrical fault detection; Performance evaluation; Production; Test equipment; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.921886

Filename

921886