Title :
A comparison of transient digitization methods for high speed analog signals
Author :
Nayak, Neeraj ; Yu, Baiying ; Black, William C., Jr.
Author_Institution :
Analog & Mixed Signal VLSI Design Centre, Iowa State Univ., Ames, IA, USA
Abstract :
Two techniques for high-speed transient digitization of analog signals are described and compared. One approach employs a traditional high-speed flash ADC that performs real-time digitization and the other uses a fast analog memory that is slowly read out and digitized. Both techniques have been realized in a digital 0.25 μm bulk CMOS process. The strengths and weaknesses of the two approaches are presented, and the measured data compared
Keywords :
CMOS integrated circuits; analogue-digital conversion; signal processing equipment; 0.25 micron; digital CMOS process; fast analog memory; high speed analog signals; high-speed flash ADC; high-speed transient digitization; real-time digitization; transient digitization methods; Analog memory; Analog-digital conversion; CMOS process; Clocks; Frequency; Modems; Sampling methods; Signal design; System testing; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.921926
