DocumentCode
1745156
Title
A comparison of transient digitization methods for high speed analog signals
Author
Nayak, Neeraj ; Yu, Baiying ; Black, William C., Jr.
Author_Institution
Analog & Mixed Signal VLSI Design Centre, Iowa State Univ., Ames, IA, USA
Volume
1
fYear
2001
fDate
6-9 May 2001
Firstpage
595
Abstract
Two techniques for high-speed transient digitization of analog signals are described and compared. One approach employs a traditional high-speed flash ADC that performs real-time digitization and the other uses a fast analog memory that is slowly read out and digitized. Both techniques have been realized in a digital 0.25 μm bulk CMOS process. The strengths and weaknesses of the two approaches are presented, and the measured data compared
Keywords
CMOS integrated circuits; analogue-digital conversion; signal processing equipment; 0.25 micron; digital CMOS process; fast analog memory; high speed analog signals; high-speed flash ADC; high-speed transient digitization; real-time digitization; transient digitization methods; Analog memory; Analog-digital conversion; CMOS process; Clocks; Frequency; Modems; Sampling methods; Signal design; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.921926
Filename
921926
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