Title :
A statistical methodology for the design of high-performance current steering DAC´s
Author :
Crippa, Paolo ; Conti, Marco ; Turchetti, Claudio
Author_Institution :
Dipt. di Elettronica e Autom., Ancona Univ., Italy
Abstract :
Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures
Keywords :
CMOS integrated circuits; circuit CAD; digital-analogue conversion; integrated circuit design; integrated circuit modelling; statistical analysis; CMOS DAC; DNL; INL; MOS drain current; autocorrelation function; behavioral model; current steering DAC; design methodology; high-performance DAC; high-resolution D/A converters; mismatch modelling; static performances; statistical methodology; statistical modeling; Autocorrelation; Circuits; Covariance matrix; Design methodology; Fluctuations; Mathematical model; Semiconductor device modeling; Statistical analysis; Stochastic processes;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922047
