Title : 
Statistical analysis of the time-delay digital tanlock loop in the presence of Gaussian noise
         
        
            Author : 
Hussain, Zahir M. ; Boashash, Boualem
         
        
            Author_Institution : 
Signal Processing Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
         
        
        
        
        
        
            Abstract : 
In this work we analyze the performance of the newly proposed digital tanlock loop in the presence of additive Gaussian noise. It is shown that the expected value of the steady-state phase errors at the input and the output of the phase error detector are equal to the noise-free steady-state values, while the variance is significantly reduced when the signal-to-noise ratio is increased or the phase shift (introduced by the time-delay) approaches 90-degrees
         
        
            Keywords : 
Gaussian noise; circuit noise; delay lock loops; digital phase locked loops; statistical analysis; additive Gaussian noise; phase error detector; phase shift; signal-to-noise ratio; statistical analysis; steady-state phase error; time-delay digital tanlock loop; variance; Additive noise; Detectors; Gaussian noise; Noise reduction; Performance analysis; Phase detection; Phase noise; Signal to noise ratio; Statistical analysis; Steady-state;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
         
        
            Conference_Location : 
Sydney, NSW
         
        
            Print_ISBN : 
0-7803-6685-9
         
        
        
            DOI : 
10.1109/ISCAS.2001.922158