Title :
Power trends and performance characterization of 3-dimensional integration
Author :
Zhang, Rongtian ; Roy, Kaushik ; Koh, Cheng-Kok ; Janes, David B.
Author_Institution :
ECE, Purdue Univ., West Lafayette, IN, USA
Abstract :
3-D technology promises higher integration density and lower interconnection complexity and delay. At present, however, not much work on circuit applications has been done due to lack of insight into 3-D circuit architecture and performance. One of the purposes of realizing 3-D integration is to reduce the Interconnect complexity and delay of 2-D, which is widely avowed as the barrier to the continued performance gains in the future technology generations. Therefore, in this paper, we present a stochastic 3-D interconnect model, study the impact of 3-D integration on circuit performance and power consumption. We show that 3-D structures effectively reduce the number of long delay nets, significantly reduce the number of repeaters, and dramatically improve the circuit performance. With 3-D integration, a circuit can be clocked at frequencies much higher (double, even triple) than with 2-D. However, we also show that the impacts of vertical wires on chip area and interconnect delay can be limiting factors on the vertical integration of device layers; and that 3-D integration offers limited relief of power consumption
Keywords :
integrated circuit interconnections; integrated circuit modelling; interconnect delay; power consumption; repeater; stochastic model; three-dimensional integrated circuit technology; vertical integration; Circuit optimization; Clocks; Delay effects; Energy consumption; Frequency; Integrated circuit interconnections; Performance gain; Repeaters; Stochastic processes; Wires;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922261