• DocumentCode
    1745389
  • Title

    Analysis of quartz and langasite STW device acceleration sensitivity

  • Author

    Kosinski, John A. ; Pastore, Robert A., Jr.

  • Author_Institution
    U.S. Army CECOM, Ft. Monmouth, NJ, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    36800
  • Firstpage
    227
  • Abstract
    The acceleration sensitivity of STW on rotated Y-cut langasite is analyzed and compared to that of STW on rotated Y-cut quartz
  • Keywords
    accelerometers; lanthanum compounds; quartz; surface acoustic wave sensors; La3Ga5SiO14; STW device; SiO2; acceleration sensitivity; langasite; quartz; rotated Y-cut crystal; Acceleration; Circuit noise; Dielectric materials; Elasticity; Material properties; Oscillators; Piezoelectric devices; Q factor; Temperature; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2000 IEEE
  • Conference_Location
    San Juan
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-6365-5
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2000.922545
  • Filename
    922545
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1745389