• DocumentCode
    1745397
  • Title

    The experimental SAW propagation characteristics of sputtered zirconium titanate on lithium niobate

  • Author

    Hickernell, Fred S.

  • Author_Institution
    Univ. of Central Florida, Phoenix, AZ, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    36800
  • Firstpage
    333
  • Abstract
    The SAW propagation properties of sputtered zirconium titanate on lithium niobate have been characterized experimentally. Three thicknesses of amorphous ZrTiO4 (105, 220 and 420 nm) were magnetron sputtered from a composite target onto Y-cut Z-propagating LiNbO3. The films were analyzed by RBS to determine density values and element concentrations. The SAW propagation properties were carried out over a frequency range from 34 MHz to above 1.0 GHz with pairs of 100 nm aluminum-film interdigital-transducer electrodes. The SAW velocity dispersion characteristic was unique to each film and did not fit a consistent pattern as a function of film-thickness to acoustic-wavelength ratio. Elastic constants were estimated for each of the three films from the SAW velocity dispersion characteristics. The SAW propagation loss in dB/cm increased as the frequency squared. The loss also increased with increasing film thickness. The application of ZrTiO4 amorphous films to increase the SAW coupling factor was also investigated
  • Keywords
    dielectric thin films; elastic constants; lithium compounds; sputtered coatings; surface acoustic waves; zirconium compounds; 34 MHz to 1.0 GHz; LiNbO3; RBS; SAW coupling factor; SAW propagation loss; SAW velocity dispersion; ZrTiO4; aluminum film interdigital transducer electrode; elastic constants; lithium niobate substrate; magnetron sputtering; zirconium titanate amorphous film; Acoustic propagation; Amorphous magnetic materials; Amorphous materials; Electrodes; Frequency; Lithium niobate; Magnetic analysis; Surface acoustic waves; Titanium compounds; Zirconium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2000 IEEE
  • Conference_Location
    San Juan
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-6365-5
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2000.922566
  • Filename
    922566