Title :
Fabrication of SAW device coupled with semiconductor
Author :
Kaneshiro, C. ; Noge, S. ; Hong, C. ; Koh, K. ; Aoki, Y. ; Hohkawa, K.
Author_Institution :
Kanagawa Inst. of Technol., Japan
Abstract :
This paper reports a fabrication of Si/LiNbO3 coupled device by using improved film bonding process. In order to prevent a thermal strain of the film due to the different thermal expansion in the film bonding process, we applied local heating processes to obtain the tight bonding force of the interfaces by using a microwave heating process as well as an infrared laser heating process. We can apply the local heating process to the fabrication of SAW-semiconductor coupled device. We fabricated a test device with Si/LiNbO3 structure for low cost of mass production. It would be expected to realize the highly functional devices
Keywords :
elemental semiconductors; lithium compounds; silicon; surface acoustic wave devices; wafer bonding; SAW-semiconductor coupled device; Si-LiNbO3; Si/LiNbO3 interface; fabrication; film bonding; infrared laser heating; local heating; mass production; microwave heating; thermal expansion; thermal strain; Bonding forces; Bonding processes; Capacitive sensors; Fabrication; Infrared heating; Microwave devices; Semiconductor films; Surface acoustic wave devices; Thermal expansion; Thermal force;
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
Print_ISBN :
0-7803-6365-5
DOI :
10.1109/ULTSYM.2000.922572