Title :
Ternary cache: Three-valued MLC STT-RAM caches
Author :
Seokin Hong ; Jongmin Lee ; Soontae Kim
Author_Institution :
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
Spin-transfer torque random access memory (STT-RAM) has become a promising non-volatile memory technology for cache memories. Recently, 2-bit multi-level cell (MLC) STT-RAM has been proposed to enhance data density, but it suffers from low reliability of its read and write operations. In this paper, we propose a novel cache design called Ternary cache. In Ternary cache, a memory cell can store three values (i.e., 0,1,2) while MLC STT-RAM can store four values. In this way, Ternary cache achieves much higher read stability than MLC STT-RAM-based caches. To enhance writability, a write operation is performed with high current and terminated as soon as the data is written. Evaluation results show that Ternary cache achieves the data density benefit of MLC STT-RAM and the reliability benefit of SLC STT-RAM.
Keywords :
cache storage; random-access storage; reliability; MLC STT-RAM cache; MLC STT-RAM-based cache; cache design; cache memory; data density benefit; memory cell; multilevel cell; nonvolatile memory technology; read stability; reliability benefit; spin-transfer torque random access memory; ternary cache; writability; write operation; Error analysis; Magnetic domains; Magnetic tunneling; Monitoring; Reliability; Resistance; Switches;
Conference_Titel :
Computer Design (ICCD), 2014 32nd IEEE International Conference on
Conference_Location :
Seoul
DOI :
10.1109/ICCD.2014.6974666