Title :
Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber
Author :
Park, Y. ; Ahn, T.-J. ; Kim, Y.H. ; Han, W.-T. ; Paek, U.-C. ; Kim, D.Y.
Author_Institution :
Dept. of Inf. & Commun., Kwangju Inst. of Sci. & Technol., South Korea
Abstract :
A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8 pm.
Keywords :
aluminium; boron; erbium; germanium; internal stresses; optical fibre testing; optical polarisers; photoelasticity; stress measurement; B-Ge doped fiber; Er-Al doped fiber; optical fiber; photoelastic effect profile; photoelastic effect profiles; residual stress measurement; residual stress profile; spatial resolution; Fiber lasers; Optical fiber devices; Optical fiber polarization; Optical fibers; Optical refraction; Optical variables control; Photoelasticity; Refractive index; Residual stresses; Stress measurement;
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 2001. OFC 2001
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-655-9
