DocumentCode :
1746247
Title :
Solder parameter sensitivity for CSP life-time prediction using simulation-based optimization method
Author :
Vandevelde, Bart ; Beyne, Eric ; Zhang, Kouchi ; Caers, Jo
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2001
fDate :
2001
Firstpage :
281
Lastpage :
287
Abstract :
Finite element modelling is widely used for estimating the solder joint reliability of electronic packages. However, the solder properties are strong process and geometry dependent. Even for the same type of solder, measurements conducted by different people at different locations show different results, due to differences in application conditions, benching etc. Those differences may lead to difference in constitutive equations and/or the parameter values. Therefore the effect of the solder parameter variation and parameter sensitivity should be taken into account before a reliable solder fatigue prediction can be made. In this research, simulation-based optimisation method is used to investigate the sensitivity of the chosen solder parameters for the solder fatigue prediction using inelastic strain criterion
Keywords :
chip scale packaging; fatigue; finite element analysis; optimisation; reliability; soldering; CSP; constitutive equations; finite element modelling; inelastic strain criterion; life-time prediction; parameter values; simulation-based optimization method; solder fatigue prediction; solder parameter sensitivity; Chip scale packaging; Difference equations; Electronics packaging; Fatigue; Finite element methods; Geometry; Lead; Optimization methods; Predictive models; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927736
Filename :
927736
Link To Document :
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