• DocumentCode
    1746373
  • Title

    Numerical determination of electric field forces and capacitance of pressure condenser microphone

  • Author

    Dadic, Martin

  • Author_Institution
    Fac. of Electr. Eng. & Comput., Zagreb Univ., Croatia
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    971
  • Abstract
    Nonuniform deflection of pressure condenser microphone membrane causes nonlinearities between peak deflection of membrane and induced voltage. The microphone\´s capacitance was determined for the first time with finite element method. The dependence of capacitance and inverse capacitance dependence on deflection is fitted by a polynomial. These data are used for determination of static point and electric field force. The dependence of inverse capacitance (proportional to the induced voltage) on deflection can be approximated with a third order polynomial, and electric field force with a second order polynomial. There is a major influence of the nonlinearity of the inverse capacitance (maximal per cent change of the gradient up to 4%) compared to the nonlinearity of the overall force (maximal per cent change of the gradient under 0.15%) on the microphone\´s overall nonlinearity. The geometry of the analyzed microphone is deduced from values for a 1" microphone
  • Keywords
    capacitance; capacitive sensors; finite element analysis; membranes; microphones; nonlinear distortion; pressure transducers; electric field forces; finite element method; induced voltage; inverse capacitance; nonlinear distortions; nonuniform membrane deflection; peak deflection; polynomial fitting; pressure condenser microphone; second order polynomial; static point; third order polynomial; Biomembranes; Capacitance; Finite element methods; Geometry; Microphones; Nonlinear distortion; Nonlinear equations; Polynomials; Shape; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.928224
  • Filename
    928224