DocumentCode
174645
Title
DFM is dead - Long live DFM
Author
Aitken, Robert ; Pietromonaco, David ; Cline, Brian
Author_Institution
ARM R&D, San Jose, CA, USA
fYear
2014
fDate
19-22 Oct. 2014
Firstpage
300
Lastpage
307
Abstract
For many years, a key aspect of Design-for-Manufacturability (DFM) has been adjustment of polygons in standard cell layout. Similarly, radically restricted design rules and unidirectional layout have been proposed as DFM-friendly design styles with the ability to dramatically improve yield. This paper looks at the history of such approaches over the last few technology nodes and shows that as we approach 10nm and beyond, both of these techniques have essentially run their course as lithography restrictions and related effects increasingly dictate key aspects of standard cell layout. In their place, new approaches to manufacturability and yield are increasingly important.
Keywords
design for manufacture; integrated circuit layout; integrated circuit yield; lithography; DFM; design-for-manufacturability; lithography restrictions; polygons; size 10 nm; standard cell layout; Layout; Libraries; Lithography; Logic gates; Metals; Routing; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2014 32nd IEEE International Conference on
Conference_Location
Seoul
Type
conf
DOI
10.1109/ICCD.2014.6974697
Filename
6974697
Link To Document