• DocumentCode
    174645
  • Title

    DFM is dead - Long live DFM

  • Author

    Aitken, Robert ; Pietromonaco, David ; Cline, Brian

  • Author_Institution
    ARM R&D, San Jose, CA, USA
  • fYear
    2014
  • fDate
    19-22 Oct. 2014
  • Firstpage
    300
  • Lastpage
    307
  • Abstract
    For many years, a key aspect of Design-for-Manufacturability (DFM) has been adjustment of polygons in standard cell layout. Similarly, radically restricted design rules and unidirectional layout have been proposed as DFM-friendly design styles with the ability to dramatically improve yield. This paper looks at the history of such approaches over the last few technology nodes and shows that as we approach 10nm and beyond, both of these techniques have essentially run their course as lithography restrictions and related effects increasingly dictate key aspects of standard cell layout. In their place, new approaches to manufacturability and yield are increasingly important.
  • Keywords
    design for manufacture; integrated circuit layout; integrated circuit yield; lithography; DFM; design-for-manufacturability; lithography restrictions; polygons; size 10 nm; standard cell layout; Layout; Libraries; Lithography; Logic gates; Metals; Routing; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2014 32nd IEEE International Conference on
  • Conference_Location
    Seoul
  • Type

    conf

  • DOI
    10.1109/ICCD.2014.6974697
  • Filename
    6974697