DocumentCode
1746679
Title
A novel approach to designing aliasing-free space compactors based on switching theory formulation
Author
Das, Sunil R. ; Assaf, Mansour H. ; Petriu, Emil M. ; Jone, Wen B. ; Chakrabarty, Krishnendu
Author_Institution
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont., Canada
Volume
1
fYear
2001
fDate
21-23 May 2001
Firstpage
198
Abstract
This paper suggests a novel approach to designing zero-aliasing space compactors utilizing switching theory concepts of Hamming distance, sequence weights, cover table and frequency ordering, together with concept of Nth order missed error probability estimates under stochastic dependence of line errors for detectable single stuck line faults of the CUT. The advantages of aliasing-free space compaction over earlier techniques are evidently clear-zero-aliasing is achieved without any modifications of the CUT, the area overhead and signal propagation delay are relatively less compared to conventional parity tree linear compactors, and the approach used works equally well with both deterministic and pseudorandom test sets
Keywords
Hamming codes; automatic test pattern generation; built-in self test; circuit complexity; combinational circuits; data compression; error statistics; logic testing; switching theory; BIST; Hamming distance; aliasing-free space compactors design; area overhead; combinational circuit testing; cover table; data compression; detectable single stuck line faults; deterministic test sets; frequency ordering; heuristic approach; line errors; missed error probability estimates; pseudorandom test sets; sequence weights; signal propagation delay; stochastic dependence; switching theory formulation; zero-aliasing space compactors; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Fault detection; Frequency estimation; Hamming distance; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location
Budapest
ISSN
1091-5281
Print_ISBN
0-7803-6646-8
Type
conf
DOI
10.1109/IMTC.2001.928812
Filename
928812
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