• DocumentCode
    1746763
  • Title

    Assembly reliability evaluation method (AREM)

  • Author

    Suzuki, Tatsuya ; Ohashi, Toshijiro ; Asano, Masaaki ; Miyakawa, Seii

  • Author_Institution
    Production Eng. Res. Lab., Hitachi Ltd., Yokohama, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    294
  • Lastpage
    299
  • Abstract
    This paper introduces an effective new design-for-quality tool called AREM that visualizes assembly fault potential. Its evaluation formula is constructed on a fault occurrence model and enables quantitative evaluation of the fault generation potential of both product and assembly shop. The distinctive features of AREM are:(1) visualization of parts and operations having a high fault probability detection capability; (2) easy input by symbol selection as well as simultaneous assemblability evaluation; and (3) shop reliability, as well as product reliability, can be evaluated quantitatively. The method can be integrated with other DFX tools such as the assemblability evaluation method (AEM), and the recyclability/disassemblability evaluation method (REM/DEM) to realize a comprehensive production design evaluation system
  • Keywords
    assembling; data visualisation; design for manufacture; reliability theory; AEM; AREM; DFX tools; REM/DEM; assemblability evaluation method; assembly fault potential visualization; assembly reliability evaluation method; comprehensive production design evaluation system; design-for-quality tool; fault generation potential; fault occurrence model; high fault probability detection capability; product reliability; quantitative evaluation; recyclability/disassemblability evaluation method; shop reliability; simultaneous assemblability evaluation; symbol selection; Assembly systems; Companies; Design for quality; Fault detection; Fault diagnosis; Laboratories; Manufacturing; Production engineering; Reliability engineering; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Assembly and Task Planning, 2001, Proceedings of the IEEE International Symposium on
  • Conference_Location
    Fukuoka
  • Print_ISBN
    0-7803-7004-X
  • Type

    conf

  • DOI
    10.1109/ISATP.2001.929038
  • Filename
    929038