DocumentCode :
1747171
Title :
A high-speed high-resolution vision system for the inspection of TFT LCD
Author :
Kim, Jung-Hun ; Ahn, Suk ; Jeon, Jae Wook ; Byun, Jong-Eun
Author_Institution :
Sch. of Electr. & Comput. Eng., Sungkyunkwan Univ., Kyungki, South Korea
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
101
Abstract :
As the resolution and size of the TFT LCD are becoming higher and larger, respectively, its inspection system is required to have high resolution to detect dirt, impurities, cracks, etc. Also, in order to reduce the cost to inspect TFT LCD, the inspection time must be reduced. One of the most important subsystems in the TFT LCD inspection system is a vision system. But existing vision systems are insufficient to perform inspection tasks for a large TFT LCD during a short time. A high-speed high-resolution vision system for the inspection of large TFT LCD is proposed and developed in this paper. In order to have desired resolution over a large area, the proposed vision system can obtain image information through line scan cameras rather than expensive high-resolution area cameras. In order to reduce task time, this vision system consists of four high-performance digital signal processors (DSP). A parallel architecture and a pipeline algorithm are developed to reduce time to process image data of multiple line scan cameras. Based on these architectures and algorithm, an appropriate task will be assigned to each DSP, which results in reducing image-processing time. Through a PCI bus, the developed vision system can be connected to a personal computer (PC) that can provide a convenient user interface. Some experiments that show the performance of the developed vision system will be performed
Keywords :
automatic optical inspection; cameras; computer vision; liquid crystal displays; parallel architectures; pipeline processing; printed circuit testing; thin film transistors; AOI; PCI bus; TFT LCD inspection; cracks; digital signal processors; dirt; high-speed high-resolution vision system; impurities; inspection time; line scan cameras; parallel architecture; personal computer; pipeline algorithm; user interface; Cameras; Costs; Digital signal processing; Image resolution; Impurities; Inspection; Machine vision; Signal processing algorithms; Signal resolution; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on
Conference_Location :
Pusan
Print_ISBN :
0-7803-7090-2
Type :
conf
DOI :
10.1109/ISIE.2001.931763
Filename :
931763
Link To Document :
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