Real-time inspection system for printed circuit boards

Author

Kim, Nam-Hyeong ; Pyun, Jae-Young ; Choi, Kang-Sun ; Choi, Byeong-Doo ; Ko, Sung-Jea

Author_Institution

Dept. of Electron. Eng., Korea Univ., Seoul, South Korea

Volume

1

fYear

2001

fDate

2001

Firstpage

166

Abstract

The PCB inspection system presented in this paper can detect defects including the breaks in the wires and short circuit and is significantly faster when compared to the existing techniques. The proposed inspection method is based on referential matching between the stored reference image and the test (observed) image. Block matching is performed to solve the misalignment in referential matching. In order to reduce the computational complexity, we implement the proposed algorithm using the single instruction multiple data (SIMD) instructions, so called SSE2

Keywords

automatic optical inspection; computational complexity; fault location; image matching; printed circuits; real-time systems; wires (electric); AOI; PCB inspection system; SSE2; automated optical inspection; block matching; computational complexity reduction; defects detection; printed circuit boards; real-time inspection system; referential matching; short circuit detection; single instruction multiple data instructions; stored reference image; test image; wire breaks detection; Circuit testing; Computational complexity; Computer errors; Design methodology; Humans; Image processing; Inspection; Printed circuits; Real time systems; Wires;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on

Conference_Location

Pusan

Print_ISBN

0-7803-7090-2

Type

conf

DOI

10.1109/ISIE.2001.931775

Filename

931775