Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA

Author

Sato, Y. ; Monden, M. ; Miyake, Y. ; Kajihara, S.

Author_Institution

Kyushu Inst. of Technol., Fukuoka, Japan

fYear

2014

fDate

18-21 Nov. 2014

Firstpage

59

Lastpage

67

Abstract

Ring Oscillators are used for variety of purposes to enhance reliability on LSIs or FPGAs. This paper introduces an aging-tolerant design structure of ring oscillators that are used in FPGAs. The structure is able to reduce NBTI-induced degradation in a ring oscillator´s frequency by setting PMOS transistors of look-up tables in an off-state when the oscillator is not working. The evaluation of a variety of ring oscillators using Altera Cyclone IV device (60nm technology) shows that the proposed structure is capable of controlling degradation level as well as reducing more than 37% performance degradation compared to the conventional oscillators.

Keywords

MOSFET; field programmable gate arrays; large scale integration; logic gates; negative bias temperature instability; table lookup; Altera Cyclone IV device; FPGA; LSI reliability; NBTI-induced degradation; PMOS transistors; aging-tolerant design structure; look-up tables; ring oscillators; size 60 nm; Degradation; Field programmable gate arrays; MOSFET; Ring oscillators; Table lookup; Temperature measurement; Aging; FPGA; NBTI; Ring Oscillator;

fLanguage

English

Publisher

ieee

Conference_Titel

Dependable Computing (PRDC), 2014 IEEE 20th Pacific Rim International Symposium on

Conference_Location

Singapore

Print_ISBN

978-1-4799-6473-4

Type

conf

DOI

10.1109/PRDC.2014.16

Filename

6974752