DocumentCode
1747639
Title
Self organizing maps as a tool for software analysis
Author
Pedrycz, W. ; Succi, G. ; Reformat, M. ; Musilek, P. ; Bai, X.
Author_Institution
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume
1
fYear
2001
fDate
2001
Firstpage
93
Abstract
Software measures (metrics) are indicators describing complexity of software products and processes. By their very nature, software measures give rise to a number of complex and highly dimensional data (patterns) that attempt to provide some useful insights into the very nature of the software systems. Such findings help to investigate and quantify the key properties of the systems such as their reliability, maintainability, readability, etc. In this study, self-organizing maps (SOMs) are considered as a vehicle for analysis of multidimensional data. From the functional point of view, SOMs are neural networks that map highly dimensional data into low dimensional (usually two-dimensional) space in such a way that the topology of the data is preserved. The construction of a map is realized through a process of unsupervised learning. Owing to the visualization capabilities arising in the two-dimensional space, one can visualize a structure in the original data and identify potential clusters as well as their size (compactness) and mutual distribution in the map. In this study, analysis of software data concerning JAVA classes is being carried out
Keywords
data visualisation; self-organising feature maps; software maintenance; software metrics; software quality; software reliability; unsupervised learning; JAVA classes; maintainability; readability; reliability; self organizing maps; software analysis; software complexity; software data; software metrics; unsupervised learning; visualization capabilities; Data analysis; Data visualization; Maintenance; Multidimensional systems; Neural networks; Self organizing feature maps; Software measurement; Software systems; Software tools; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2001. Canadian Conference on
Conference_Location
Toronto, Ont.
ISSN
0840-7789
Print_ISBN
0-7803-6715-4
Type
conf
DOI
10.1109/CCECE.2001.933665
Filename
933665
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