DocumentCode :
1747873
Title :
Layout-driven hot-carrier degradation minimization using logic restructuring techniques
Author :
Chih-Wei Chang ; Kai Wang ; Marek-Sadowska, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
2001
fDate :
22-22 June 2001
Firstpage :
97
Lastpage :
102
Abstract :
The rapid advances in semiconductor manufacturing technology have created tough reliability problems. Failure mechanisms such as hot-carrier effect, dielectric breakdown, electrostatic discharge and electromigration have posed tremendous threats to the long-term reliability of VLSI circuits. As a result, designers not only need analysis tools to locate the problem, but also design-for-reliability tools to correct it. However, these problems often surface when the physical layout is done and relatively few logic changes can be made. In this paper, we target the performance optimization issues in the context of hot-carrier induced degradation. A layout driven approach combining rewiring, discrete gate resizing, and pin reordering is proposed. Experimental results show that rewiring-based incremental logic restructuring is a very powerful technique in post-layout design for reliability.
Keywords :
circuit layout CAD; circuit optimisation; electromigration; electrostatic discharge; failure analysis; hot carriers; integrated circuit layout; integrated circuit reliability; logic CAD; design-for-reliability tools; dielectric breakdown; discrete gate resizing; electromigration; electrostatic discharge; failure mechanisms; hot-carrier effect; incremental logic restructuring; layout-driven hot-carrier degradation; logic restructuring techniques; long-term reliability; performance optimization issues; physical layout; pin reordering; post-layout design; reliability problems; rewiring; Degradation; Dielectric breakdown; Electrostatic discharge; Failure analysis; Hot carrier effects; Hot carriers; Logic; Minimization; Semiconductor device manufacture; Semiconductor device reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2001. Proceedings
Conference_Location :
Las Vegas, NV, USA
ISSN :
0738-100X
Print_ISBN :
1-58113-297-2
Type :
conf
DOI :
10.1109/DAC.2001.156116
Filename :
935485
Link To Document :
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