• DocumentCode
    1747874
  • Title

    An algorithm for bi-decomposition of logic functions

  • Author

    Mishchenko, Alan ; Steinbach, Bernd ; Perkowski, Marek

  • Author_Institution
    Portland State Univ., OR, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    We propose a new BDD-based method for decomposition of multi-output incompletely specified logic functions into netlists of two-input logic gates. The algorithm uses the internal don´t-cares during the decomposition to produce compact well-balanced netlists with short delay. The resulting netlists are provably nonredundant and facilitate test pattern generation. Experimental results over MCNC benchmarks show that our approach outperforms SIS and other BDD-based decomposition methods in terms of area and delay of the resulting circuits with comparable CPU time.
  • Keywords
    automatic test pattern generation; binary decision diagrams; delays; logic gates; logic testing; BDD-based method; MCNC benchmarks; area; bi-decomposition; delay; internal don´t-cares; multi-output incompletely specified logic functions; nonredundant netlists; test pattern generation; two-input logic gates; Benchmark testing; Boolean functions; Circuits; Data structures; Delay effects; Logic functions; Logic gates; Partitioning algorithms; Permission; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2001. Proceedings
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-297-2
  • Type

    conf

  • DOI
    10.1109/DAC.2001.156117
  • Filename
    935486