Title :
A novel method for stochastic nonlinearity analysis of a CMOS pipeline ADC
Author :
Goren, David ; Shamsaev, Eliyahu ; Wagner, Israel A.
Author_Institution :
IBM Haifa Res. Lab., Israel
Abstract :
An analytic approach is presented for estimating the nonlinearity of an analog to digital converter (ADC) as a function of the variations in the circuit devices. The approach is demonstrated for the case of a pipeline ADC with digital error correction. Under some mild assumptions on the expected variations, the error probability is expressed as a simple explicit function of the standard deviations in the components´ parameters: gain errors, comparator offset errors and resistor errors. The analytical expression is verified for Integral Non Linearity (INL), and its limits are studied using Monte-Carlo simulations of a 10 bit pipeline ADC structure.
Keywords :
CMOS integrated circuits; Monte Carlo methods; analogue-digital conversion; circuit simulation; comparators (circuits); error correction; error statistics; pipeline processing; 10 bit; CMOS pipeline ADC; Monte-Carlo simulations; comparator offset errors; digital error correction; error probability; explicit function; gain errors; integral nonlinearity; resistor errors; standard deviations; stochastic nonlinearity analysis; Analog-digital conversion; CMOS analog integrated circuits; CMOS digital integrated circuits; Error correction; Error probability; Linearity; Permission; Pipelines; Process design; Stochastic processes;
Conference_Titel :
Design Automation Conference, 2001. Proceedings
Print_ISBN :
1-58113-297-2
DOI :
10.1109/DAC.2001.156121
