• DocumentCode
    1747945
  • Title

    An interconnect energy model considering coupling effects

  • Author

    Uchino, Taku ; Cong, Jason

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    555
  • Lastpage
    558
  • Abstract
    This paper first presents an analytical interconnect energy model with consideration of event coupling, which is not considered by the conventional 1/2 CV2 model. Our energy calculation algorithm has the same time complexity as the 1/2 CV2 model, and is several orders of magnitude faster than HSPICE with less than 5% error. In comparison, the error of the 1/2 CV2 model can be as high as 100%.
  • Keywords
    circuit simulation; computational complexity; discrete event simulation; integrated circuit interconnections; integrated circuit modelling; coupling effects; error; event coupling; interconnect energy model; time complexity; Analytical models; Capacitance; Computer science; Crosstalk; Gold; Permission; Pins; Tail; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2001. Proceedings
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-297-2
  • Type

    conf

  • DOI
    10.1109/DAC.2001.156201
  • Filename
    935570
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1747945