Title :
An interconnect energy model considering coupling effects
Author :
Uchino, Taku ; Cong, Jason
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Abstract :
This paper first presents an analytical interconnect energy model with consideration of event coupling, which is not considered by the conventional 1/2 CV2 model. Our energy calculation algorithm has the same time complexity as the 1/2 CV2 model, and is several orders of magnitude faster than HSPICE with less than 5% error. In comparison, the error of the 1/2 CV2 model can be as high as 100%.
Keywords :
circuit simulation; computational complexity; discrete event simulation; integrated circuit interconnections; integrated circuit modelling; coupling effects; error; event coupling; interconnect energy model; time complexity; Analytical models; Capacitance; Computer science; Crosstalk; Gold; Permission; Pins; Tail; Voltage; Wire;
Conference_Titel :
Design Automation Conference, 2001. Proceedings
Print_ISBN :
1-58113-297-2
DOI :
10.1109/DAC.2001.156201
