DocumentCode :
1747960
Title :
Statistical design space exploration for application-specific unit synthesis
Author :
Bruni, Davide ; Bogliolo, Alessandro ; Benini, Luca
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fYear :
2001
fDate :
2001
Firstpage :
641
Lastpage :
646
Abstract :
The capability of performing semi-automated design space exploration is the main advantage of high-level synthesis with respect to RTL design. However, design space exploration performed during; high-level synthesis is limited in scope, since it provides promising solutions that represent good starting points for subsequent optimizations, but it provides no insight about the overall structure of the design space. In this work we propose unsupervised Monte-Carlo design exploration and statistical characterization to capture the key features of the design space. Our analysis provides insight on how various solutions are distributed over the entire design space. In addition, we apply extreme value theory (1997) to extrapolate achievable bounds from the sampling points.
Keywords :
Monte Carlo methods; application specific integrated circuits; circuit optimisation; high level synthesis; integrated circuit design; RTL design; application-specific unit synthesis; design space exploration; extreme value theory; high-level synthesis; semi-automated design; statistical design; unsupervised Monte-Carlo design; Boosting; Constraint optimization; Cost function; Design optimization; Embedded software; Graphics; High level synthesis; Permission; Sampling methods; Space exploration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2001. Proceedings
ISSN :
0738-100X
Print_ISBN :
1-58113-297-2
Type :
conf
DOI :
10.1109/DAC.2001.156217
Filename :
935586
Link To Document :
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