DocumentCode :
1747962
Title :
Functional correlation analysis in crosstalk induced critical paths identification
Author :
Xiao, T. ; Marek-Sadowska, M.
Author_Institution :
Sun Microsyst. Inc., Palo Alto, CA, USA
fYear :
2001
fDate :
22-22 June 2001
Firstpage :
653
Lastpage :
656
Abstract :
In deep submicron digital circuits capacitive couplings make delay of a switching signal highly dependent on its neighbors´ switching times and switching directions. A long path may have a large number of coupling neighbors with difficult to determine interdependencies. Ignoring the mutual relationship among the signals may result in a very pessimistic estimation of circuit delay. In this paper, we apply efficient functional correlation analysis techniques to identify critical paths caused by crosstalk delay effects. We also discuss applications to static timing optimization. Experiments demonstrate efficacy of the proposed technique.
Keywords :
VLSI; combinational circuits; correlation methods; crosstalk; delays; integrated circuit measurement; logic gates; timing; capacitive couplings; circuit delay; crosstalk delay effects; crosstalk induced critical paths identification; deep submicron digital circuits; functional correlation analysis; static timing optimization; switching directions; switching times; Cause effect analysis; Coupling circuits; Crosstalk; Delay effects; Delay estimation; Digital circuits; Switches; Switching circuits; Timing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2001. Proceedings
Conference_Location :
Las Vegas, NV, USA
ISSN :
0738-100X
Print_ISBN :
1-58113-297-2
Type :
conf
DOI :
10.1109/DAC.2001.156219
Filename :
935588
Link To Document :
بازگشت