DocumentCode
1748617
Title
New perspectives on geometric reflection theory from rough surfaces
Author
Lundberg, Andrew J. ; Wolff, Lawrence B. ; Socolinsky, Diego A.
Author_Institution
Comput. Vision Lab., Johns Hopkins Univ., MD, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
225
Abstract
Exact wave theories of specular reflectance from rough surfaces are computationally intractable thus motivating the practical need for geometric reflectance models which treat only the geometric ray nature of light reflection. The cornerstone of geometric reflectance modeling from rough surfaces in computer vision and computer graphics over the past two decades has been the Torrance-Sparrow model. This model has worked well as an intuitive description of rough surfaces as a collection of planar Fresnel reflectors called microfacets together with the concept of geometric attenuation for light which is obscured during reflection under an assumed rough surface geometry. Experimental data and analysis show that the current conceptualization of how specularly reflected light rays geometrically interact with rough surfaces needs to be seriously revised. The Torrance-Sparrow model while in qualitative agreement with specular reflection from rough surfaces is seen to be quantitatively inaccurate. Furthermore there are conceptual inconsistencies upon which derivation of this reflectance model is based. We show how significant quantitative improvement can be achieved for a geometric reflectance model by making some fundamental revisions to notions of microfacet probability distributions and geometric attenuation. Work is currently undergoing, to relate physical surface reconstructions from Atomic Force Microscope data to reflectance data from these same surfaces
Keywords
computer graphics; computer vision; rough surfaces; surface reconstruction; Torrance-Sparrow model; computer graphics; computer vision; exact wave theories; geometric attenuation; geometric ray nature; geometric reflectance model; geometric reflection theory; light reflection; microfacets; planar Fresnel reflectors; qualitative agreement; rough surfaces; specular reflectance; Atomic force microscopy; Fresnel reflection; Optical reflection; Reflectivity; Rough surfaces; Solid modeling; Surface reconstruction; Surface roughness; Surface treatment; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision, 2001. ICCV 2001. Proceedings. Eighth IEEE International Conference on
Conference_Location
Vancouver, BC
Print_ISBN
0-7695-1143-0
Type
conf
DOI
10.1109/ICCV.2001.937522
Filename
937522
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