Title :
Real-time feature tracking and outlier rejection with changes in illumination
Author :
Jin, Hailin ; Favaro, Paolo ; Soatto, Stefano
Author_Institution :
Dept. of Electr. Eng., Washington Univ., St. Louis, MO, USA
Abstract :
We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combined model of geometry and photometry, that is used to track features as well as to detect outliers in a hypothesis testing framework. The algorithm runs in real time on a personal computer; and is available to the public
Keywords :
computational geometry; computer vision; real-time systems; affine deformations; geometry; image patches; outlier rejection; photometry; point features; real-time feature tracking; Application software; Computer science; Layout; Lighting; Microcomputers; Photometry; Real time systems; Robustness; Target tracking; Testing;
Conference_Titel :
Computer Vision, 2001. ICCV 2001. Proceedings. Eighth IEEE International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7695-1143-0
DOI :
10.1109/ICCV.2001.937588
