• DocumentCode
    1748796
  • Title

    Comparison of neural networks and an optical thin-film multilayer model for connectionist learning

  • Author

    Li, Xiaodong

  • Author_Institution
    Dept. of Comput. Sci., R. Melbourne Inst. of Technol., Vic., Australia
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1727
  • Abstract
    Current work on connectionist models has been focused largely on artificial neural networks that are inspired by the networks of biological neurons in the human brain. However there are also other connectionist architectures that differ significantly from this biological exemplar. Li and Purvis (1999) proposed a connectionist learning architecture inspired by the physics associated with optical coatings of multiple layers of thin-films. The proposed model differs significantly from the widely used neuron-inspired models. With thin-film layer thicknesses serving as adjustable parameters (as compared with connection weights in a neural network) for the learning system, the optical thin-film multilayer model (OTFM) is capable of approximating virtually any kind of highly nonlinear mappings. We focus on a detailed comparison of a typical neural network model and the OTFM. We describe the architecture of the OTFM and show how it can be viewed as a connectionist learning model. We then present the experimental results of using the OTFM in solving a classification problem typical of conventional connectionist architectures
  • Keywords
    learning (artificial intelligence); optical films; optical neural nets; thin films; connectionist learning; highly nonlinear mappings; optical coatings; optical thin-film multilayer model; Artificial neural networks; Biological neural networks; Biological system modeling; Brain modeling; Humans; Multi-layer neural network; Neural networks; Neurons; Optical films; Thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-7044-9
  • Type

    conf

  • DOI
    10.1109/IJCNN.2001.938422
  • Filename
    938422