• DocumentCode
    1749226
  • Title

    Analysis of the practical capacity of multi-valued hetero-associator considering fault tolerance

  • Author

    Tsai, Cheng-Fa

  • Author_Institution
    Dept. of Manage. Inf. Syst., Nat. Pingtung Univ. of Sci. & Technol., Pingtung, Taiwan
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1156
  • Abstract
    Presents a method of pattern recognition using the multi-valued polynomial bidirectional hetero-associator (PBHA). This network can be used for the industrial application of optical character recognition. According to detailed simulations, the PBHA has a higher capacity for pattern pair storage than that of the conventional bidirectional associative memories and fuzzy memories. Meanwhile, the practical capacity of a PBHA considering fault tolerance is discussed. The fault tolerance requirement leads to the discovery of the attraction radius of the basin for each stored pattern pair. The PBHA takes advantage of multi-valued characteristics in evolution equations such that the signal-noise-ratio is significantly increased. We apply the result of this research to pattern recognition problems. The practical capacity of the multi-valued data recognition using the PBHA considering fault tolerance in the worst case is also estimated. Simulation results are presented to verify the derived theory
  • Keywords
    content-addressable storage; fault tolerance; neural nets; optical character recognition; attraction radius; evolution equations; fault tolerance; multi-valued polynomial bidirectional hetero-associator; optical character recognition; pattern pair storage; pattern recognition; practical capacity; signal-noise-ratio; Associative memory; Equations; Fault tolerance; Fuzzy neural networks; Fuzzy sets; Fuzzy systems; Neural networks; Optical character recognition software; Pattern recognition; Polynomials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-7044-9
  • Type

    conf

  • DOI
    10.1109/IJCNN.2001.939524
  • Filename
    939524