Title : 
Overtraining in fuzzy ARTMAP: Myth or reality?
         
        
            Author : 
Georgiopoulos, Michael ; Koufakou, Anna ; Anagnostopoulos, Georgios C. ; Kasparis, Takis
         
        
            Author_Institution : 
Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL, USA
         
        
        
        
        
        
            Abstract : 
We examine the issue of overtraining in fuzzy ARTMAP. Over-training in fuzzy ARTMAP manifests itself in two different ways: 1) it degrades the generalization performance of fuzzy ARTMAP as training progresses; and 2) it creates unnecessarily large fuzzy ARTMAP neural network architectures. In this work we demonstrate that overtraining happens in fuzzy ARTMAP and propose an old remedy for its cure: cross-validation. In our experiments we compare the performance of fuzzy ARTMAP that is trained: 1) until the completion of training, 2) for one epoch, and 3) until its performance on a validation set is maximized. The experiments were performed on artificial and real databases. The conclusion derived from these experiments is that cross-validation is a useful procedure in fuzzy ARTMAP, because it produces smaller fuzzy ARTMAP architectures with improved generalization performance. The trade-off is that cross-validation introduces additional computational complexity in the training phase of fuzzy ARTMAP
         
        
            Keywords : 
ART neural nets; computational complexity; fuzzy neural nets; generalisation (artificial intelligence); learning (artificial intelligence); computational complexity; cross-validation; fuzzy ARTMAP; fuzzy neural network; generalization; learning phase; Computational complexity; Computer architecture; Computer science; Databases; Degradation; Fuzzy neural networks; Fuzzy sets; Neural networks; Supervised learning; Testing;
         
        
        
        
            Conference_Titel : 
Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
         
        
            Conference_Location : 
Washington, DC
         
        
        
            Print_ISBN : 
0-7803-7044-9
         
        
        
            DOI : 
10.1109/IJCNN.2001.939529