• DocumentCode
    17495
  • Title

    Reliability of Series-Parallel Systems With Random Failure Propagation Time

  • Author

    Levitin, Gregory ; Liudong Xing ; Ben-Haim, Hanoch ; Yuanshun Dai

  • Author_Institution
    Reliability Dept., Israel Electr. Corp., Haifa, Israel
  • Volume
    62
  • Issue
    3
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    637
  • Lastpage
    647
  • Abstract
    This paper presents an algorithm for evaluating the reliability and performance distribution of complex non-repairable series-parallel multi-state systems with common cause failures caused by propagation of failures in system elements. The failure propagation can have a selective effect, which means that the failures originating from different elements can cause failures of different subsets of system elements. The failure propagation time is assumed to be a random value with a given distribution. The suggested algorithm is based on the universal generating function approach, and a generalized reliability block diagram method (recursive aggregation of pairs of elements and their replacement by an equivalent one). The evaluation procedure is repeated for each combination of elements affected by the common cause failures. Illustrative examples are provided.
  • Keywords
    failure analysis; random processes; reliability theory; set theory; common cause failures; complex nonrepairable series-parallel multistate systems; failure propagation; failure propagation time; generalized reliability block diagram method; performance distribution evaluation; random failure propagation time; random value; recursive element pair aggregation; reliability evaluation; system element subset failures; universal generating function approach; Performance evaluation; Polynomials; Probability density function; Random variables; Reliability; System performance; Throughput; Common cause failure; multi-state system; propagated failure; propagation time; reliability block diagram; selective effect;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2013.2270415
  • Filename
    6550027