Title : 
Nonlinear behavior in piezoelectric ceramic transducers
         
        
            Author : 
Takahashi, S. ; Sasaki, Y. ; Umeda, M. ; Nakamura, K. ; Ueha, S.
         
        
            Author_Institution : 
Functional Devices & Mater. Res., NEC Corp., Kawasaki, Japan
         
        
        
        
        
        
            Abstract : 
In recent years intensive development efforts have been devoted to new piezoelectric high-power devices, such as ultrasonic motors, piezoelectric actuators, and piezoelectric transformers. Piezoelectric ceramic transducers used in these devices are usually driven at a high level of vibration stress in a resonant mode. To optimize the performance of such devices, it is essential to understand the nonlinear behavior which appears in the relatively higher power range for a transducer. This nonlinear behavior has not yet been thoroughly studied, however, because a method for measuring it in a resonant mode has not been widely accepted. In this review an electrical transient response method that allows observation of nonlinear behavior in a resonant mode was introduced. The dependence of electromechanical characteristics on vibration stress under electric field-free conditions in lead-zirconate-titanate ceramics was discussed
         
        
            Keywords : 
lead compounds; piezoceramics; piezoelectric transducers; transient response; vibrations; PZT; PbZrO3TiO3; electrical transient response; electromechanical characteristics; high-power device; nonlinearity; piezoelectric ceramic transducer; resonant mode; vibration stress; Ceramics; Ferroelectric materials; Piezoelectric devices; Piezoelectric materials; Piezoelectric transducers; Resonance; Stress; Transformers; Transient response; Vibration measurement;
         
        
        
        
            Conference_Titel : 
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
         
        
            Conference_Location : 
Honolulu, HI
         
        
        
            Print_ISBN : 
0-7803-5940-2
         
        
        
            DOI : 
10.1109/ISAF.2000.941503