Dielectric, piezoelectric and strain properties of PMW-PNN-PZT

Author

Yoon, K.H. ; Yoo, J.H. ; Min, S.-K. ; Lee, S.-H. ; Hong, J.I. ; Park, C.Y.

Author_Institution

Dept. of Electr. Eng., Semyung Univ., Chungbuk, South Korea

Volume

1

fYear

2000

fDate

2000

Firstpage

499

Abstract

In this paper, the structural, dielectric, piezoelectric and strain properties of Pb[(Mg_1/2W_1/2)_x-(Ni_1/3Nb _2/3)_0.15-x-(Zr₀ _.5Ti_0.5)_0.85]O₃ (X-0-0~0.10) ceramics were investigated with the substitution of Pb(Mg_1/2W_1/2)O₃. According to the increase of the substitution amount of Pb(Mg_1/2W_1/2)O₃, Curie temperatures and coercive fields were decreased by the decrease of the tetragonality. Up to the substitution amount of Pb(Mg_1/2W_1/2)O₃ 3 mol%, remnant polarization, dielectric constant and piezoelectric constant were increased. When the substitution amount of Pb(Mg_1/2W_1/2)O₃ was 3 mol%, the dielectric constant and electromechanical coupling factor, k_p, k₃₁, showed the highest value of 2230, 0.64 and 038, respectively. Also, the piezoelectric constant was the largest value of 418, 202 (×10^-12 C/N), respectively. The strain induced by AC electric field (60 Hz) was increased with the increase of the substitution amount of Pb(Mg_/2W_/2)O₃

Keywords

ferroelectric Curie temperature; ferroelectric ceramics; lead compounds; permittivity; piezoceramics; 60 Hz; Curie temperature; PMW-PNN-PZT ceramic; PbMgWO3-PbNiNbO3-PbZrO3TiO3; PbMgWO₃-PbNiNbO₃-PZT; chemical substitution; coercive field; dielectric constant; dielectric properties; electromechanical coupling factor; piezoelectric constant; piezoelectric properties; remnant polarization; strain properties; structural properties; Capacitive sensors; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Educational institutions; Piezoelectric actuators; Powders; Strain measurement; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on

Conference_Location

Honolulu, HI

ISSN

1099-4734

Print_ISBN

0-7803-5940-2

Type

conf

DOI

10.1109/ISAF.2000.941606

Filename

941606