DocumentCode :
1750045
Title :
Aging studies of some Pb(Mg1/3Nb2/3)O3 -PbTiO3-(Ba,Sr)TiO3 ceramics
Author :
DiAntonio, C.B. ; Pilgrim, S.M.
Author_Institution :
New York State Coll. of Ceramics, Alfred Univ., NY, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
507
Abstract :
Relaxor ferroelectrics, such as PMN, have a nonconventional domain structure compared to a normal ferroelectric; and thus have aging characteristics that manifest themselves in a somewhat different manner. The focus of this research is to study the effects of aging on PMN based compositions. The samples tested include a number of compositions in the Pb(Mg1/3Nb2/3)O3PbTiO3 -(Ba,Sr)TiO3 ternary. The samples were originally fabricated using a columbite precursor mixed oxide method. The electromechanical properties (strain and hysteresis), polarization and weak field permittivity were measured as a function of frequency and temperature for samples aged around ten years. The characteristic "saddle" in the dielectric temperature curves has been investigated for its dependence on time, temperature and frequency. A spectral analysis of these responses shows that the aging effects are apparent in the higher harmonics of the material
Keywords :
ageing; barium compounds; dielectric polarisation; electrostriction; ferroelectric ceramics; lead compounds; magnesium compounds; niobium compounds; permittivity; strontium compounds; Pb(Mg1/3Nb2/3)O3-PbTiO3 -(Ba,Sr)TiO3; PbMgO3NbO3-PbTiO3-(BaSr)TiO 3; aging characteristics; columbite precursor mixed oxide method; dielectric temperature curves; electromechanical properties; electrostrictive ceramics; harmonics; nonconventional domain structure; polarization; relaxor ferroelectrics; spectral analysis; weak field permittivity; Aging; Ferroelectric materials; Frequency; Hysteresis; Niobium; Polarization; Relaxor ferroelectrics; Strain measurement; Temperature dependence; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.941608
Filename :
941608
Link To Document :
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