Title :
A fractional-N DPLL with adaptive spur cancellation and calibration-free injection-locked TDC in 65nm CMOS
Author :
Cheng-Ru Ho ; Chen, Mike Shuo-Wei
Author_Institution :
Dept. of Electr. Eng. - Electrophys., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
A robust and low-cost fractional-N digital phase locked loop (DPLL) architecture is demonstrated via the proposed adaptive spur cancellation schemes and calibration-free time-to-digital converter (TDC). By leveraging the injection locked ring oscillator, the TDC achieves a fine resolution of ~7 ps that automatically tracks the period of digital controlled oscillator (DCO) and hence no TDC gain calibration is required over PVT. To suppress the spurious tones due to external or internal interferences, a gradient-based adaptive spur cancellation scheme is proposed and demonstrated more than 40 dB improvement in the lab measurement. The proof-of-concept DPLL prototype is implemented in 65 nm CMOS and synthesizes frequencies between 2.7 to 4.8 GHz with fine frequency resolution of 610 Hz. The measured phase noise is -130 dBc/Hz at 3 MHz offset and the reference spur achieves -86.45 dBc.
Keywords :
CMOS digital integrated circuits; digital phase locked loops; integrated circuit noise; oscillators; phase noise; time-digital conversion; CMOS; DCO; PVT; TDC gain calibration; calibration-free injection-locked TDC; digital controlled oscillator; digital phase locked loop; external interference; frequency 610 Hz; gradient-based adaptive spur cancellation scheme; injection locked ring oscillator; internal interference; lab measurement; low-cost fractional-N DPLL architecture; phase noise; proof-of-concept DPLL prototype; size 65 nm; spurious tone suppression; time-to-digital converter; CMOS integrated circuits; Calibration; Frequency measurement; Frequency synthesizers; Phase locked loops; Prototypes; Quantization (signal); ADPLL; DPLL; gradient descent; injection lock; interference cancellation; time-to-digital converter;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2014 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4799-3862-9
DOI :
10.1109/RFIC.2014.6851668