DocumentCode :
175171
Title :
A cascade RF power sensor based on GaAs MMIC for improved dynamic range application
Author :
Zhenxiang Yi ; Xiaoping Liao ; Zhiqiang Zhang
Author_Institution :
Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing, China
fYear :
2014
fDate :
1-3 June 2014
Firstpage :
201
Lastpage :
204
Abstract :
In this paper, a novel cascade power sensor with improved dynamic range is proposed. The terminating-type sensor and the coupling-type sensor are designed in series for low and high power detection, respectively. This device is designed and fabricated by GaAs MMIC process and MEMS technology. Impedance matching by increasing the slot width of the CPW transmission line is realized to optimize microwave performance. The measured return loss is close to -28dB and -26dB at 8GHz and 12GHz, respectively. For the incident power of 1mW to 100mW, the terminating-type sensor works and the measured sensitivity is close to 0.095mV/mW, 0.088mV/mW and 0.084mV/mW, at 8GHz, 10GHz and 12GHz, respectively. For the incident power with the improved dynamic range of 100mW to 150mW, the coupling-type sensor is adopted and the sensitivity is 9.2μV/mW, 8.6μV/mW and 9.0μV/mW at 8GHz, 10GHz and 12GHz, respectively.
Keywords :
III-V semiconductors; MMIC; coplanar waveguides; electric sensing devices; gallium arsenide; impedance matching; micromechanical devices; microwave detectors; CPW transmission line; GaAs; MEMS technology; MMIC process; cascade RF power sensor; coupling-type sensor; frequency 10 GHz; frequency 12 GHz; frequency 8 GHz; high power detection; impedance matching; improved dynamic range application; low power detection; power 1 mW to 150 mW; terminating-type sensor; Coplanar waveguides; Micromechanical devices; Microwave measurement; Microwave technology; Power measurement; Transmission line measurements; Voltage measurement; Coupling-type; GaAs MMIC; MEMS membrane; RF power sensor; Terminating-type;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2014 IEEE
Conference_Location :
Tampa, FL
ISSN :
1529-2517
Print_ISBN :
978-1-4799-3862-9
Type :
conf
DOI :
10.1109/RFIC.2014.6851697
Filename :
6851697
Link To Document :
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