Multi-anode sawtooth SDD for X-ray spectroscopy fabricated on NTD wafers

Author

aonský, J. ; Hollander, R.W. ; van Eijk, C.W.E. ; Sarro, P.M. ; Kouchpil, V.

Author_Institution

Interfaculty Reactor Inst., Delft Univ. of Technol., Netherlands

Volume

1

fYear

2000

fDate

2000

Firstpage

42442

Abstract

We are developing a multi-anode sawtooth Si drift detector (MSSDD) with an anode pitch of 250 μm for one-dimensional position sensitive detection of low energy X-rays down to ~200 eV. The detector is intended to be used in X-ray diffraction analysis. In this paper we present new results of X-ray spectroscopy measurements with detectors fabricated on neutron transmutation doped (NTD) wafers with a thickness of 290 μm. Using an MSSDD with an anode pitch of 250 μm and having p⁺ strips on both sides, we have measured an energy resolution of 191 eV FWHM per anode pixel for the 5.89 keV line of ⁵⁵Fe at 213 K. At room temperature the energy resolution is 375 eV FWHM. Split events are almost completely eliminated due to the sawtooth shaped p⁺ strips

Keywords

X-ray diffraction; X-ray spectroscopy; position sensitive particle detectors; silicon radiation detectors; 200 eV; 213 K; 250 micron; 290 micron; 293 K; 5.89 keV; Si; X-ray diffraction; X-ray spectroscopy; energy resolution; low energy X-rays; multi-anode sawtooth Si drift detector; neutron transmutation doped wafers; p⁺ strips; Anodes; Energy resolution; Neutrons; Position sensitive particle detectors; Spectroscopy; Strips; Thickness measurement; X-ray detection; X-ray detectors; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949000

Filename

949000