Author :
Kwan, S. ; Appel, J.A. ; Butler, J.N. ; Cardoso, G. ; Cheung, H. ; Chiodini, G. ; Christian, D.C. ; Gottschalk, E.E. ; Hall, B.K. ; Hoff, J. ; Kasper, P.A. ; Kutschke, R. ; Mekkaoui, A. ; Yarema, R. ; Zimmermann, S. ; Newsom, C. ; Colautti, A. ; Menasce,
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied
Keywords :
meson detection; position sensitive particle detectors; silicon radiation detectors; 6 plane silicon microstrip telescope; ADC bits; BTeV silicon pixel detector; Si; applied external magnetic field; pixel detector spatial resolution; single-chip silicon pixel planes; track inclination; Bonding; Detectors; Mesons; Microstrip; Performance evaluation; Silicon; Spatial resolution; Target tracking; Telescopes; Testing;
