Beam test results of the BTeV silicon pixel detector

Author

Kwan, S. ; Appel, J.A. ; Butler, J.N. ; Cardoso, G. ; Cheung, H. ; Chiodini, G. ; Christian, D.C. ; Gottschalk, E.E. ; Hall, B.K. ; Hoff, J. ; Kasper, P.A. ; Kutschke, R. ; Mekkaoui, A. ; Yarema, R. ; Zimmermann, S. ; Newsom, C. ; Colautti, A. ; Menasce,

Author_Institution

Fermi Nat. Accel. Lab., Batavia, IL, USA

Volume

1

fYear

2000

fDate

2000

Firstpage

17958

Abstract

We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied

Keywords

meson detection; position sensitive particle detectors; silicon radiation detectors; 6 plane silicon microstrip telescope; ADC bits; BTeV silicon pixel detector; Si; applied external magnetic field; pixel detector spatial resolution; single-chip silicon pixel planes; track inclination; Bonding; Detectors; Mesons; Microstrip; Performance evaluation; Silicon; Spatial resolution; Target tracking; Telescopes; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949011

Filename

949011