Production and testing of the DØ silicon microstrip tracker

Author

DO Collaboration

Author_Institution

Fermilab, Batavia, IL

Volume

1

fYear

2000

fDate

2000

Abstract

The DØ collaboration is completing production of a 793,000 channel-silicon strip tracking system for the DØ upgrade. The tracker consists of 768 ladder and wedge assemblies including both single and double sided detectors. The production process includes burn-in of electronics, mechanical assembly under coordinate measuring machines, wirebonding, repair of bad channels, detector burn-in, laser testing, and final assembly. We describe observed failure modes of the detectors, including microdischarge and lithography defects. We present results of the production and testing process, and describe the anticipated, performance of the detector. Lessons for future production of large scale tracking systems are discussed

Keywords

failure analysis; lead bonding; nuclear electronics; position sensitive particle detectors; silicon radiation detectors; Ø; D0 silicon microstrip tracker; Si; coordinate measuring machines; detector burn-in; double sided detectors; failure modes; large scale tracking systems; laser testing; lithography defects; mechanical assembly; microdischarge; silicon strip tracking system; single sided detectors; wirebonding; Assembly; Collaboration; Coordinate measuring machines; Detectors; Electronic equipment testing; Laser modes; Microstrip; Production systems; Silicon; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949017

Filename

949017